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Scanning electron microscope (SEM) analyses

Testing Methods in Materials Testing (DT)

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High-resolution analysis of surfaces and structures

The scanning electron microscope provides high-resolution images and analytical data at scales far below the resolution limit of conventional light microscopy. Combined with energy-dispersive X-ray spectroscopy (EDX), it enables precise determination of local elemental composition as well as morphology and topography.

Possible applications include damage analyses, such as fracture surface examination and the investigation of corrosion phenomena, microstructural characterisation, particle analysis, and examination of coatings and interfaces.

SEM analysis with EDX evaluation
DAkkS-accredited testing services
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How does scanning electron microscope analysis work?

In scanning electron microscope analyses, W.S. Werkstoff Service examines samples using a finely focused electron beam. The surface is scanned line by line, producing high-resolution images. This enables detailed assessment of fracture surfaces, particles, coatings, microstructural constituents and interfaces. Combined with EDX, local elemental compositions can be determined. Characteristic X-ray signals generated by the electron beam are evaluated for this purpose. The results support damage analyses, material assessments and quality control and are documented in a traceable manner.

Further questions & answers

Supplementary or similar procedures

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