Scanning electron microscopy (SEM) and microanalysis (EDX)

Would you like to examine particles and coating systems using microanalysis methods? Do you need scanning electron microscopic analyses of surfaces? Are you looking for a partner to analyse wear conditions or fractures? Or do you need to solve problems using scanning electron microscopy methods?

The specialists and engineers at our W.S. MaterialtestCenter support you with scanning electron microscopy and microanalysis.

We offer the following scanning electron microscopy services:

• Surface analyses and topographical examinations
• Coating analyses and particle examinations (shape, size, composition)
• Fractographic analyses and fracture surface examinations
• Microanalysis using EDX (e.g. phase/element mapping and element line scans)
• Examination of non-conductive samples under low vacuum