Scanning electron microscopy (SEM) and micro-analytics (EDX)

Do you want to check particles and layer systems using microanalytic methods? Do you require analyses of surfaces using scanning electron microscopy? Are you looking for a partner for analyzing the state of wear or fractures? Do you need to solve problems using scanning electron microscopy methods?
The specialists and engineers from our MaterialtestCenter will support you in the area of scanning electron microscopy and micro-analytics.

The services we offer around scanning electron microscopy include:  

• Surface analyses and topography investigations
• Layer analyses and particle investigations (form, size, composition)
• Fractographic analyses and investigations of fracture surfaces
• Micro-analytics with EDX (e.g. phase/element mappings and element line scans)
• Investigation of non-conductive samples in a low vacuum